FEM analysis of current limiting devices using superconducting thin film and AC losses of YBCO coated conductor

H. Ohsaki (Department of Advanced Energy, Graduate School of Frontier Sciences, The University of Tokyo, Japan)
Y. Ichiki (Department of Advanced Energy, Graduate School of Frontier Sciences, The University of Tokyo, Japan)
S. Sugita (Tokyo Electric Power Company, Japan)

Abstract

A numerical analysis tool has been developed to study electromagnetic characteristics of high‐temperature superconducting thin film used for a resistive‐type fault current limiter (FCL) and coated conductor. It adopts the finite element method based on current vector potentials with thin‐plate approximation. Transport current, temperature dependence and strong non‐linearity of electromagnetic properties, and state transition of superconductor are taken into account by solving a three‐dimensional coupled problem of electromagnetic field, an electric circuit and thermal field. Then using this numerical analysis tool the current imbalance and current limiting characteristics of a FCL device, the influence of inhomogeneity of superconducting properties on them, and AC losses in YBCO coated conductor are studied.

Keywords

Citation

Ohsaki, H., Ichiki, Y. and Sugita, S. (2004), "FEM analysis of current limiting devices using superconducting thin film and AC losses of YBCO coated conductor", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 23 No. 4, pp. 1092-1099. https://doi.org/10.1108/03321640410553526

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Publisher

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Emerald Group Publishing Limited

Copyright © 2004, Emerald Group Publishing Limited

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