The Contamination Audit ‐ A Vital Tool For Yield Improvement

S. Hamilton (Teknek Electronics Ltd, Bridge of Weir, Renfrewshire, Scotland)

Circuit World

ISSN: 0305-6120

Publication date: 1 December 1996

Abstract

With the increasing trends towards fineline circuitry, contamination has become a major cause of defects. This paper outlines the techniques used in conducting a Contamination Audit and in generating a Contamination Matrix, which is a map of the types of contamination and their relative levels within a facility. Using the Contamination Matrix contamination control measures can be targetted in the most effective manner to achieve yield improvements.

Keywords

Citation

Hamilton, S. (1996), "The Contamination Audit ‐ A Vital Tool For Yield Improvement", Circuit World, Vol. 22 No. 3, pp. 23-25. https://doi.org/10.1108/03056129610799994

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Publisher

:

MCB UP Ltd

Copyright © 1996, MCB UP Limited

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