Chemical characterisation of materials in electronic systems using infrared spectroscopy

Abstract

Purpose

The purpose of the paper is to discuss the chemical characterisation of inorganic and organic materials found in electronic systems.

Design/methodology/approach

The paper provides an introduction to Fourier transform infrared spectroscopy, which is used for the chemical characterisation and analysis of materials. Examples from recent case studies are given to illustrate the work.

Findings

It was found that Fourier transform infrared spectroscopy can successfully identify materials at various stages of their lifecycle. By this means any contaminants and their resulting detrimental effects can be eliminated.

Originality/value

The paper demonstrates how the chemical analysis of a material is conducted, and what can be learned from the investigation.

Citation

Smith, C.A. (2007), "Chemical characterisation of materials in electronic systems using infrared spectroscopy", Circuit World, Vol. 33 No. 3, pp. 38-47. https://doi.org/10.1108/03056120710777013