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Cost optimization of accelerated burn‐in

Y.V. Hui (City University of Hong Kong, Hong Kong)
W.L. Lu (City University of Hong Kong, Hong Kong)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 1 October 1996

362

Abstract

The reliability of a product is generally concerned with failures during its operating life. Accelerated (stress) burn‐in before shipment will reject poor quality products and avoid a high initial mortality rate in residual life. It is justified when the expected proportion of a product being defective is high in the infant stage and where early removal of defects will improve reliability in service. Studies economic designs of stress screening plans where every finished product is subject to burn‐in. Examines the optimal burn‐in time in minimizing total testing, manufacturing, quality and reliability costs. Discusses the effect of burn‐in stress level.

Keywords

Citation

Hui, Y.V. and Lu, W.L. (1996), "Cost optimization of accelerated burn‐in", International Journal of Quality & Reliability Management, Vol. 13 No. 7, pp. 69-78. https://doi.org/10.1108/02656719610128574

Publisher

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MCB UP Ltd

Copyright © 1996, MCB UP Limited

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