A software reliability growth model

Nalina Suresh (University of Wisconsin‐Eau Claire, Eau Claire, Wisconsin, USA)
A.N.V. Rao (University of South Florida, Tampa, Florida, USA)
A.J.G. Babu (Seton Hall University, South Orange, New Jersey, USA)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Publication date: 1 April 1996


Most of the existing software reliability models assume time between failures to follow an exponential distribution. Develops a reliability growth model based on non‐homogeneous Poisson process with intensity function given by the power law, to predict the reliability of a software. Several authors have suggested the use of the non‐homogeneous Poisson process to assess the reliability growth of software and to predict their failure behaviour. Inference procedures considered by these authors have been Bayesian in nature. Uses an unbiased estimate of the failure rate for prediction. Compares the performance of this model with Bayes empirical‐Bayes models and a time series model. The model developed is realistic, easy to use, and gives a better prediction of reliability of a software.



Suresh, N., Rao, A. and Babu, A. (1996), "A software reliability growth model", International Journal of Quality & Reliability Management, Vol. 13 No. 3, pp. 84-94. https://doi.org/10.1108/02656719610116108

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Copyright © 1996, MCB UP Limited

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