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Planning accelerated life tests under Exponentiated‐Weibull‐Arrhenius model

Gladys D.C. Barriga (Faculdade de Ciências e Letras de Araraquara, UNESP, Araraquara, Brazil)
Linda Lee Ho (EP, Universidade de São Paulo, São Paulo, Brazil)
Vicente G. Cancho (ICMC, Universidade de São Paulo, São Paulo, Brazil)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 27 June 2008

Abstract

Purpose

The purpose of this paper is to present designs for an accelerated life test (ALT).

Design/methodology/approach

Bayesian methods and simulation Monte Carlo Markov Chain (MCMC) methods were used.

Findings

In the paper a Bayesian method based on MCMC for ALT under EW distribution (for life time) and Arrhenius models (relating the stress variable and parameters) was proposed. The paper can conclude that it is a reasonable alternative to the classical statistical methods since the implementation of the proposed method is simple, not requiring advanced computational understanding and inferences on the parameters can be made easily. By the predictive density of a future observation, a procedure was developed to plan ALT and also to verify if the conformance fraction of the manufactured process reaches some desired level of quality. This procedure is useful for statistical process control in many industrial applications.

Research limitations/implications

The results may be applied in a semiconductor manufacturer.

Originality/value

The Exponentiated‐Weibull‐Arrhenius model has never before been used to plan an ALT.

Keywords

Citation

Barriga, G.D.C., Lee Ho, L. and Cancho, V.G. (2008), "Planning accelerated life tests under Exponentiated‐Weibull‐Arrhenius model", International Journal of Quality & Reliability Management, Vol. 25 No. 6, pp. 636-653. https://doi.org/10.1108/02656710810881926

Publisher

:

Emerald Group Publishing Limited

Copyright © 2008, Emerald Group Publishing Limited