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Cross‐generational knowledge flows in edge organizations

Jay Liebowitz (Department of Information Technology, Carey Business School, Johns Hopkins University, Rockville, Maryland, USA)
Nirmala Ayyavoo (Department of Information Technology, Carey Business School, Johns Hopkins University, Rockville, Maryland, USA)
Hang Nguyen (Department of Information Technology, Carey Business School, Johns Hopkins University, Rockville, Maryland, USA)
Deborah Carran (JHU School of Education, Johns Hopkins University, Columbia, Maryland, USA)
James Simien (Institute for Distribution and Assignment Systems, Navy Personnel Research Studies and Technology (NPRST), Millington, Tennessee, USA)

Industrial Management & Data Systems

ISSN: 0263-5577

Article publication date: 2 October 2007

3409

Abstract

Purpose

This paper seeks to investigate how cross‐generational biases affect tacit knowledge transfer and resulting knowledge flows in edge organizations.

Design/methodology/approach

The paper applied hypothesis testing χ2s, as well as ethnographic analysis.

Findings

Cross‐generational biases affect tacit knowledge transfer and resulting knowledge flows in edge‐like organizations. Other factors, such as trust, loyalty, work ethics, and family values, also affect knowledge flows.

Research limitations/implications

Sample size should be increased for future work, as well as applying the results in a defense/military environment.

Practical implications

The results of the paper should influence succession planning, human capital strategy, and knowledge management efforts in edge‐like organizations.

Originality/value

The work is quite novel as it integrates inter‐generational differences, tacit knowledge transfer, and knowledge flows in edge organizations.

Keywords

Citation

Liebowitz, J., Ayyavoo, N., Nguyen, H., Carran, D. and Simien, J. (2007), "Cross‐generational knowledge flows in edge organizations", Industrial Management & Data Systems, Vol. 107 No. 8, pp. 1123-1153. https://doi.org/10.1108/02635570710822787

Publisher

:

Emerald Group Publishing Limited

Copyright © 2007, Emerald Group Publishing Limited

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