Embedding and characterization of fiber‐optic and thin‐film sensors in metallic structures

Xiaochun Li (University of Wisconsin‐Madison, Madison, Wisconsin, USA)
Wenliang Tang (School of Information Engineering, East China Jiaotong University, Nanchang, JiangXi Province, People's Republic of China)
Anastasios Golnas (Advantest America Inc., Buffalo Grove, Illinois, USA)

Sensor Review

ISSN: 0260-2288

Publication date: 1 December 2004

Abstract

It is often important to acquire information such as temperature and strain values from metallic tools and structures in situ. With embedded sensors, structures are capable of monitoring parameters at critical locations not accessible to ordinary sensors. To embed sensors in the functional structures, especially metallic structures, layered manufacturing is a methodology capable of rapidly and economically integrating sensors during the production of tooling or structural components. Embedding techniques for both fiber‐optic sensors and thin‐film sensors have been developed.

Keywords

Citation

Li, X., Tang, W. and Golnas, A. (2004), "Embedding and characterization of fiber‐optic and thin‐film sensors in metallic structures", Sensor Review, Vol. 24 No. 4, pp. 370-377. https://doi.org/10.1108/02602280410558403

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Publisher

:

Emerald Group Publishing Limited

Copyright © 2004, Emerald Group Publishing Limited

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