Defect inspection in transparent materials

Vanessa Pratt (Vanessa Pratt is Project/Sales Engineer for 2f1 System, Lasor AG, Berlinghausen, Germany.)
Jay Warner (Jay Warner is Project Engineer, Lasor/Systronics, 4357 Park Drive, Suite J, Norcross, GA 30093, USA. Tel: +1 770 449 7776; Fax: +1 770 449 0399; E‐mail: info@lasorsystronics.com)

Sensor Review

ISSN: 0260-2288

Publication date: 1 December 2000

Abstract

Describes a machine vision system which can be used for the detection of defects in glass ribbon and plastic sheets. Uses a system of multiple line scan CCD cameras and scanned LED light sources to detect and measure defects both along and across the web.

Keywords

Citation

Pratt, V. and Warner, J. (2000), "Defect inspection in transparent materials", Sensor Review, Vol. 20 No. 4, pp. 294-299. https://doi.org/10.1108/02602280010378001

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Publisher

:

MCB UP Ltd

Copyright © 2000, MCB UP Limited

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