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Automated test—the virtual instrument revolution

Andy Penney (Product Marketing Manager, National Instruments UK)

Assembly Automation

ISSN: 0144-5154

Article publication date: 1 June 1995

400

Abstract

Examines how the personal computer has brought about dramatic changes in automatic test equipment [ATE] in electronics manufacturing. Describes the three major instrumentation types used in ATE today, the GPIB [general purpose interface bus] the VXI [VME eXtensions for instrumentation] and DAQ [data acquisition cards]. Looks at instrument drivers which provide the programmer with an interactive front panel enabling them to manipulate the instruments using a PC mouse and keyboard. Also looks at test executive software and the three main tasks it performs of test flow control, data logging and user interfacing. Concludes that in the ever changing world of ATE, virtual instrumentation is opening the system architecture of ATE and driving costs down by capitalizing on the power and low cost of the PC.

Keywords

Citation

Penney, A. (1995), "Automated test—the virtual instrument revolution", Assembly Automation, Vol. 15 No. 2, pp. 20-24. https://doi.org/10.1108/01445159510086407

Publisher

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MCB UP Ltd

Copyright © 1995, MCB UP Limited

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