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Automatic inspection and strategy for surface defects in the PI coating process of TFT‐LCD panels

Chern‐Sheng Lin (Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan)
Jung Kuo (Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan)
Chi‐Chin Lin (Department of Computer Science and Information Engineering, National Taiwan University, Taipei, Taiwan)
Yun‐Long Lay (Department of Electronic Engineering, National Chinyi University of Technology, Taiping City, Taiwan)
Hung‐Jung Shei (Department of Mechanical Engineering, China Institute of Technology, Taipei, Taiwan)

Assembly Automation

ISSN: 0144-5154

Article publication date: 2 August 2011

Abstract

Purpose

The purpose of this paper is to apply an on‐line automatic inspection and measurement of surface defect of thin‐film transistor liquid‐crystal display (TFT‐LCD) panels in the polyimide coating process with a modified template matching method and back propagation neural network classification method.

Design/methodology/approach

By using the technique of searching, analyzing, and recognizing image processing methods, the target pattern image of TFT‐LCD cell defects can be obtained.

Findings

With template match and neural network classification in the database of the system, the program judges the kinds of the target defects characteristics, finds out the central position of cell defect, and analyzes cell defects.

Research limitations/implications

The recognition speed becomes faster and the system becomes more flexible in comparison to the previous system. The proposed method and strategy, using unsophisticated and economical equipment, is also verified. The proposed method provides highly accurate results with a low‐error rate.

Practical implications

In terms of sample training, the principles of artificial neural network were used to train the sample detection rate. In sample analysis, character weight was implemented to filter the noise so as to enhance discrimination and reduce detection.

Originality/value

The paper describes how pre‐inspection image processing was utilized in collaboration with the system to excel the inspection efficiency of present machines as well as for reducing system misjudgment. In addition, the measure for improving cell defect inspection can be applied to production line with multi‐defects to inspect and improve six defects simultaneously, which improves the system stability greatly.

Keywords

Citation

Lin, C., Kuo, J., Lin, C., Lay, Y. and Shei, H. (2011), "Automatic inspection and strategy for surface defects in the PI coating process of TFT‐LCD panels", Assembly Automation, Vol. 31 No. 3, pp. 244-250. https://doi.org/10.1108/01445151111150587

Publisher

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Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited