TY  - JOUR
AB  - Purpose– The purpose of this research is to develop an automatic optical inspection system for thin film transistor (TFT) liquid crystal display (LCD).Design/methodology/approach– A new algorithm that accounts for the closing, opening, etching, dilating, and genetic method is used. It helps to calculate the location and rotation angle for transistor patterns precisely and quickly. The system can adjust inspection platform parameters according to viewed performance. The parameter adaptation occurs in parallel with running the genetic algorithm and imaging processing methods. The proposed method is compared with the algorithms that use artificial parameter sets.Findings– This system ensures high quality in an LCD production line. This multipurpose image‐based measurement method uses unsophisticated and economical equipment, and it also detects defects in the micro‐fabrication process.Originality/value– The experiment's results show that the proposed method offers advantages over other competing methods.
VL  - 28
IS  - 1
SN  - 0144-5154
DO  - 10.1108/01445150810849037
UR  - https://doi.org/10.1108/01445150810849037
AU  - Lin Chern‐Sheng
AU  - Liao Yo‐Chang
AU  - Lay Yun‐Long
AU  - Lee Kun‐Chen
AU  - Yeh Mau‐Shiun
PY  - 2008
Y1  - 2008/01/01
TI  - High‐speed TFT LCD defect‐detection system with genetic algorithm
T2  - Assembly Automation
PB  - Emerald Group Publishing Limited
SP  - 69
EP  - 76
Y2  - 2024/04/18
ER  -