High‐speed TFT LCD defect‐detection system with genetic algorithm

Chern‐Sheng Lin (Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan)
Yo‐Chang Liao (Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan)
Yun‐Long Lay (Department of Electronic Engineering, National Chinyi University of Technology, Taichung, Taiwan)
Kun‐Chen Lee (Department of Automatic Control Engineering, Feng Chia University, Taichung, Taiwan)
Mau‐Shiun Yeh (Chung‐Shan Institute of Science and Technology, Tao‐Yuan, Taiwan)

Assembly Automation

ISSN: 0144-5154

Publication date: 22 February 2008

Abstract

Purpose

The purpose of this research is to develop an automatic optical inspection system for thin film transistor (TFT) liquid crystal display (LCD).

Design/methodology/approach

A new algorithm that accounts for the closing, opening, etching, dilating, and genetic method is used. It helps to calculate the location and rotation angle for transistor patterns precisely and quickly. The system can adjust inspection platform parameters according to viewed performance. The parameter adaptation occurs in parallel with running the genetic algorithm and imaging processing methods. The proposed method is compared with the algorithms that use artificial parameter sets.

Findings

This system ensures high quality in an LCD production line. This multipurpose image‐based measurement method uses unsophisticated and economical equipment, and it also detects defects in the micro‐fabrication process.

Originality/value

The experiment's results show that the proposed method offers advantages over other competing methods.

Keywords

Citation

Lin, C., Liao, Y., Lay, Y., Lee, K. and Yeh, M. (2008), "High‐speed TFT LCD defect‐detection system with genetic algorithm", Assembly Automation, Vol. 28 No. 1, pp. 69-76. https://doi.org/10.1108/01445150810849037

Download as .RIS

Publisher

:

Emerald Group Publishing Limited

Copyright © 2008, Emerald Group Publishing Limited

Please note you might not have access to this content

You may be able to access this content by login via Shibboleth, Open Athens or with your Emerald account.
If you would like to contact us about accessing this content, click the button and fill out the form.
To rent this content from Deepdyve, please click the button.