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Plastic ball grid array packages were aged for up to 2000 hours. Various solder ball pad metallurgies were studied and solder ball shear tests were conducted at a range of ageing times. The solder ball shear strength was found to decrease after an initial hardening stage. The deterioration of solder ball shear strength was found to be mainly caused by the formation of intermetallic compound layers, together with microstructural coarsening and diffusion related porosity at the interface. For the ball pad metallurgy, two distinct intermetallic compound layer structures were observed to have formed after ageing. Once two continuous intermetallic compound layers formed fracture tended to occur at their interface. For the ball pad metallurgies which do not form two continuous intermetallic compound layers, the shear strength still decreased, due to the coarsening of the microstructure, intermetallic particle formation and diffusion related porosity at the surface of the Ni₃Sn₄.

The purpose of this study is to address two kinds of printed circuit board (PCB) failures with electrolytic Ni/Au as the surface finish. One was the weak bondability of gold wires to Ni/Au pads and the other was “dull gold” and weak solder wettability, which both caused great loss for the PCB manufacturer.

The failure samples were studied and analyzed in terms of macro- and micro-morphology of the surface finish, its element composition and thickness by various characterization techniques, such as three-dimensional stereo microscope, scanning electron microscope, energy dispersive spectroscopy and X-ray fluorescence spectrum.

Then the causes of the two failures were both found to be the inadequate thickness of gold deposit and other surface finish defects, but these causes played different roles in either failure or the mechanisms differ. Finally, their failure mechanisms were discussed and corresponding countermeasures were put forward for prevention.

This study not only addresses a practical failure problem but also provides some clues to a better and further understanding of the effect of PCB process and management on its quality and reliability in manufacturing practice.

It sheds light on how the thickness and quality of surface finish affects its wire bonding and soldering performances.

The purpose of this work is to investigate the influence of carbon nanotube additions to solder paste on the solder joints mechanical strength and their microstructure. In our investigation, the basic solder paste contains 85 wt.% of the commercial Sn96.5Ag3Cu0.5 powder (with the particle sizes in the range of 20‐38 μm) and 15 wt.% of the self‐prepared middle activated rosin flux. To this paste we added the 0.01, 0.05 and 0.1 wt.% of the self‐modified CNT by functionalized them by mineral acid and than esterificated by methanol (FCNT_Met) or polyethylene glycol 400 (FCNT_PG). After the pastes had stabilized, the reflow soldering process of “zero ohm” chip resistors on PCBs with Ni/Au and SAC (HASL) finishes was carried out and then shear strength of the solder joints was measured. The correlations between the mechanical strength of solder joins without and with the carbon nanotubes and their microstructure were analysed.

For shear strength measurement of solder joints, the printed circuit boards with Ni/Au and SAC (HASL) finishes was applied. The SAC solder paste with different carbon nanotubes and the basic SAC solder paste as reference were used for this experiment. The automatic SMT line was applied for the paste screen printing; “zero ohms” chip resistors: 0201, 0402, 0603 and 0805 were placing on PWBs and then reflowing according to appropriate time – temperature profile. The shear strength of the solder joints was measured. For the solder joints microstructure analysis, the standard metallographic procedures were applied. Changes in the microstructure, the thickness of the intermetallic compounds and their chemical compositions were observed by means of the SEM equipped with EDS.

As the authors expected, the SAC solder paste with the carbon nanotubes addition improve the solder joints shear strength of the chip resistors mounted on PCBs with Ni/Au and SAC (HASL) finishes. The carbon nanotubes addition positive effects on IMCs thickness because of blocking their excessive growth.

It is suggested that further studies are necessary for the confirmation of the practical application, especially of the reliability properties of the solder joints obtained using solder paste with chosen carbon nanotubes.

Taking into account the shear strength data, the best results of the “nano” SAC solder pastes were obtained for the lowest addition of the carbon nanotubes modified by esterification process, especially by the methanol compared to the polyethylene glycol 400.

The obtained results made it possible to draw conclusions regarding the correlation between the output of the mechanical results and the amount of the added carbon nanotubes, and also the microstructure and thickness of the IMCs of the “nano” solder joints. It can be useful from practical point of view.

This paper presents an experimental study to assess the reliability of solder ball attachment to the bond pads of PBGA substrate for various plating schemes. The basic structure of the under bump metallisation is Cu/Ni/Au. Three different kinds of electroless plating solutions are used to deposit the Ni layer, namely, Ni‐B, Ni‐P (5 per cent), and Ni‐P (10 per cent). Also, conventional electrolytic Ni/Au plating is performed to provide a benchmark. After solder ball attachment, mechanical tests are conducted to characterize the ball shear strength for comparison. Furthermore, some specimens are subjected to multiple reflows to investigate the thermal aging effect.

Temperature cycling tests, and statistical analysis of the results, for various high‐density packages on printed‐circuit boards with Sn‐Cu hot‐air solder levelling, electroless nickel‐immersion gold, and organic solder preservative finishes are investigated in this study. Emphasis is placed on the determination of the life distribution and reliability of the lead‐free solder joints of these high‐density package assemblies while they are subjected to temperature cycling conditions. A data acquisition system, the relevant failure criterion, and the data extraction method will be presented and examined. The life test data are best fitted to the Weibull distribution. Also, the sample mean, population mean, sample characteristic life, true characteristic life, sample Weibull slope, and true Weibull slope for some of the high‐density packages are provided and discussed. Furthermore, the relationship between the reliability and the confidence limits for a life distribution is established. Finally, the confidence levels for comparing the quality (mean life) of lead‐free solder joints of high‐density packages are determined.

The wetting performance and intermetallic formation of a Sn/Ag/Cu alloy on printed circuit board (PCB) surfaces and on component terminations were studied in this work. Two different PCB surface finishes, immersion gold over electroless nickel (Ni/Au) and an organic solderability preservative (OSP), were studied. Chip components with Sn/Pb coating and a gull‐wing type component with 100% Sn coating were used in these experiments. Different reflow profiles were tested, and the dependence of the wetting performance, intermetallic layer thickness and the microstructure of the solder joints on the reflow profile were investigated.It was found that reflow process conditions did not significantly influence the spreading or intermetallic formation on either of the surfaces. Neither the wetting onto the component nor the general microstructure of the solder joints varied significantly with the reflow profile. When a Sn/Pb ‐coated component was used, the content and size of Pb‐rich phases in the solder joint increased with a longer time above liquidus or a higher reflow peak temperature.

The effect of gold (Au) on the reliability of 0.65 mm pitch surface mount solder joints between plastic quad flat packs and Cu‐Ni‐Au FR‐4 printed circuit boards was investigated. Cu‐Ni‐Au is a desirable printed circuit board finish for multi‐chip modules or printed circuit boards that would otherwise require a selective Au finish, for example for edge connectors or wire bondable parts. However, Au is known to embrittle solder when it is present in sufficiently high concentrations, creating a concern that solder joint fatigue life in service will also be adversely affected. This paper reports the results of mechanical shock, mechanical vibration and thermal cycling testing of fine pitch solder joints containing varying amounts of Au. Tests were performed on as‐soldered joints and on joints that had been heat‐treated to evolve the microstructure towards equilibrium. The tests were designed to accelerate in‐service conditions in a typical industrial environment. Under these conditions, the Au concentrations tested did not promote solder joint failures. Microstructural characterisation of the distribution and morphology of the Au‐, Ni‐ and Cu‐Sn intermetallics in the joint before and after accelerated testing was also performed. On the basis of these observations it is recommended that the Au concentration in solder joints between plastic quad flat packs and Cu‐Ni‐Au FR‐4 printed circuit boards not exceed 3.0 wt.%.

Two new electrolytically plated lead‐free surface finishes are evaluated for their wettability, bond strength, and voiding performance, and are compared with electrolytic nickel gold and an OSP. The results indicate that Ni–Sn achieve the highest wettability, one of the highest lap shear strengths, and the lowest levels of voiding. It also performs better under a long reflow profile. Under most instances, the soldering performance is comparable with, or better than, the reference OSP and Ni–Au surface finishes. Ni–PdCo–Au was found to give a poor wettability, fairly low lap shear strength, and have high levels of voiding. However, it is fairly stable, and its soldering performance is not sensitive to the reflow profile length or atmosphere, aging treatment, or flux chemistry. OSP was found to be the poorest in terms of wettability, but one of the best for lap shear strength. It also performs best under long profile, is not sensitive to reflow atmosphere, is slightly sensitive to alloy type, but is very sensitive to aging and flux chemistry.

The purpose of this paper is to investigate the influence of Bi additions on the wetting properties of SnZn7Bi alloys (Bi=1 and 3 per cent by mass) on a copper substrate and printed circuit boards (PCBs) with lead‐free finishes (SnCu, immersion Sn, Ni/Au, organic solderability preservative) in the presence of fluxes. The practical implications of the results is the main purpose of these investigations.

A wetting balance method was used for wetting measurements at 230 and 250°C in nitrogen and air atmospheres in the presence of ORM0‐ or ROL0‐type fluxes. The PCBs were investigated ‘as received’ and after accelerated aging. The analysis of variance (ANOVA) analysis was performed in order to explain how the main factors of the experiments (the Bi content in the alloy (1 or 3 per cent), the test temperature and the test atmosphere) influenced the wetting ability of SnZn7Bi on Cu substrates.

As expected, a higher temperature and a higher Bi content in the alloy favoured the wetting of the copper substrate in the presence of the ORM0‐type flux in a nitrogen atmosphere. These results were confirmed by ANOVA analysis. Very good results were also obtained for the SnZn7Bi3 alloy's wettability on “tin coatings” on PCBs (SnCu and immersion Sn) both “as received” and after aging, in the presence of the ORM0‐type flux, for all the applied testing conditions (in both temperatures and N₂ and air atmospheres). The less active flux (ROL0) caused a worsening of the alloy's wettability properties; however, the PCBs with SnCu and immersion Sn finishes maintained their wettability, even after aging, at very good and good levels, respectively.

It is suggested that further studies are necessary for confirmation of the practical application, but they should be limited to the soldering of SnZnBi3 on PCBs with “tin coatings” and the quality of the solder joint performance.

The best SnZn7Bi3 wetting results on PCBs with “tin coatings” (SnCu and immersion Sn) at 230 and 250°C and in N₂ and air atmospheres suggest the possibility of a practical usage of the tin‐zinc‐bismuth alloys for soldering in electronics using both the ORM0‐type flux and the even less active ROL0‐type flux, which are currently used in industrial lead‐free soldering processes.

The wetting balance method, combined with ANOVA was used as the quickest way to determine the wettability properties of SnZn7Bi on Cu substrates. Wettability measurements were also performed on the SnZn7 and SnZn7Bi alloys with different lead‐free finishes, in different experimental conditions.

An overview has been presented on the topic of alternative surface finishes for package I/Os and circuit board features. Aspects of processability and solder joint reliability were described for the following coatings: baseline hot‐dipped, plated, and plated‐and‐fused 100Sn and Sn‐Pb coatings; Ni/Au; Pd, Ni/Pd, and Ni/Pd/Au finishes; and the recently marketed immersion Ag coatings. The Ni/Au coatings appear to provide the all‐around best options in terms of solderability protection and wire bondability. Nickel/Pd finishes offer a slightly reduced level of performance in these areas which is most likely due to variable Pd surface conditions. It is necessary to minimize dissolved Au or Pd contents in the solder material to prevent solder joint embrittlement. Ancillary aspects that include thickness measurement techniques; the importance of finish compatibility with conformal coatings and conductive adhesives; and the need for alternative finishes for the processing of non‐Pb bearing solders are discussed.